| 摘要 |
PROBLEM TO BE SOLVED: To propose a technology to effectively select a device status item suitable for use for failure prediction of device. SOLUTION: A failure-related item extractor 12 takes the following steps in order: a step to obtain device status data included in maintenance data of image formation device (normal-system machine) in the status of nonoccurrence of failure while operating and those included in the maintenance data of image formation device (abnormal-system machine) in the status of occurrence of failure while operating, from a maintenance data storage unit 15; a step to compare a group of normal-system device status data consisting of more than one device status datum relating to the normal-system machine to a group of abnormal-system device status data consisting of more than one device status datum relating to the abnormal-system machine; a step to identify a device status item strongly linked to failure occurrence among many items about the device status; a step to generate failure-related item information in which the identified device status item is set as the device status item used for failure prediction; and a step to store the generated information in a failure-related item storage unit 16. COPYRIGHT: (C)2012,JPO&INPIT |
