| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and a method for measuring a physical state of a measurement object at high speed.SOLUTION: A physical state measurement device 100 includes: a light source 110; a splitter 120 for splitting light from the light source 110 into measurement light and reference light; transmission means for transmitting the measurement light to a measurement point of a measurement object; reference light reflection means 130 for reflecting the reference light; optical path length change means 140 for changing the optical path length of the reference light reflected from the reference light reflection means 130; wavelength conversion means 150 for wavelength converting the measurement light, reflected at the measurement point, and the reference light reflected at the reflection means 130; light receiving means 161 for receiving the measurement light and the reference light after the wavelength conversion; and measurement means 162 for measuring the physical state at the measurement point on the basis of the interference waveforms between the measurement light and the reference light received by the light receiving means 161. |
