发明名称 Trimming of operative parameters in electronic devices based on corrections mappings
摘要 An embodiment of an electronic device having a plurality of trimmable operative parameters is provided. The electronic device includes a trimming circuit for applying a plurality of trimming actions to each parameter for causing a corresponding correction of the parameter, for at least one reference parameter, a measuring circuit for measuring the reference parameter responsive to the application of at least part of the trimming actions, and for forcing the application of the selected trimming action for the reference parameter. For each non-reference parameter different from the at least one reference parameter, the electronic device includes a selection circuit for selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter, and a biasing circuit for forcing the application of the selected trimming action for each non-reference parameter.
申请公布号 US8930168(B2) 申请公布日期 2015.01.06
申请号 US201313791836 申请日期 2013.03.08
申请人 SK Hynix Inc. 发明人 Seo Donghyun;Nam Kijun;Yoon Seokseong
分类号 H04B15/00;H03K5/08;G01R31/30;G01R31/3183 主分类号 H04B15/00
代理机构 Lane Powell PC 代理人 Jablonski Kevin D.;Lane Powell PC
主权项 1. An electronic device, comprising: a trimming circuit for applying a plurality of trimming actions to each of a plurality of parameters, each trimming action causing a corresponding correction of each respective parameter; a measuring circuit for measuring at least one parameter as a reference parameter in response to the application of at least one of the trimming actions such that the at least one trimming action provides a target value of the reference parameter; a selection circuit configured to select a trimming action for each non-reference parameter different from the at least one reference parameter, and further operable to select one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter according to a mapping of each group of multiple corrections of the at least one reference parameter on a single correction of the non-reference parameter; a biasing circuit for forcing the application of the selected trimming action for the reference parameter and for forcing the application of the selected trimming action for each non-reference parameter; a storage circuit for storing a code in the electronic device for each reference parameter that is indicative of the selected trimming action for the reference parameter; and a conversion circuit for converting the code for the at least one reference parameter into a code for each non-reference parameter that is indicative of the selected trimming action for the non-reference parameter.
地址 Gyeonggi-Do KR