| 发明名称 |
PROBE TIP FORMATION FOR DIE SORT AND TEST |
| 摘要 |
Probe tip formation is described for die sort and test. In one example, the tips of wires of a test probe head are prepared for use as test probes. The wires are attached to a test probe head substrate. The end opposite the substrate has a tip. The tips of the wires are polished when attached to the test probe head to form a sharpened point. |
| 申请公布号 |
US2015002181(A1) |
申请公布日期 |
2015.01.01 |
| 申请号 |
US201313931866 |
申请日期 |
2013.06.29 |
| 申请人 |
Martin Keith J.;Stevenson Kip P.;Salloum Kamil S.;Albertson Todd P. |
发明人 |
Martin Keith J.;Stevenson Kip P.;Salloum Kamil S.;Albertson Todd P. |
| 分类号 |
G01R3/00;G01R1/073 |
主分类号 |
G01R3/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of preparing tips of wires of a test probe head for use as test probes, the test probe head having a plurality of resilient wires, the method comprising:
attaching a plurality of wires to a test probe head substrate, each of the wires having two ends, one end being attached to the substrate and the other end opposite the substrate having a tip; and polishing the tips of the wires when attached to the test probe head to form a sharpened point. |
| 地址 |
Hillsboro OR US |
