发明名称 MASS ANALYSIS DEVICE
摘要 An object of the present invention is to prevent lowering of introduction efficiency of ions and to reduce labor for a cleaning operation. In order to solve the above problems, the present invention provides a mass spectrometer where ion introduction hole of an electrode is divided into a first region, a second region, and a third region, a central axis direction of the ion introduction hole in both or either one of the first region and the third region is different from a flow direction axis of the ion inside the ion introduction hole in the second region, and axes of the ion introduction hole in the first region and the third region are in an eccentric position relationship.
申请公布号 US2015001392(A1) 申请公布日期 2015.01.01
申请号 US201214371043 申请日期 2012.12.21
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 Hasegawa Hideki;Satake Hiroyuki;Suga Masao;Hashimoto Yuichiro
分类号 H01J49/24;H01J49/06;H01J49/04;H01J49/26 主分类号 H01J49/24
代理机构 代理人
主权项 1. A mass spectrometer, which introduces ions generated under atmospheric pressure into a vacuum chamber exhausted by vacuum exhausting means and analyzes a mass of the ion, comprising: an electrode, in which ion introduction hole introducing the ion into the vacuum chamber is opened, wherein the ion introduction hole of the electrode is divided into a first region, a second region, and a third region, a central axis direction of the ion introduction hole in both or either one of the first region and the third region is different from a flow direction axis of the ion inside the ion introduction hole in the second region, the second region has no outlet other than outlets leading to the first region and the third region, the electrode can be separated between the first region and the second region or between the third region and the second region or in a midway of the second region, and axes of the ion introduction hole in the first region and the third region are in an eccentric position relationship.
地址 Tokyo JP