发明名称 Data pattern bias detection
摘要 An apparatus relating generally to data pattern bias detection is disclosed. This apparatus includes a bias detector. A slicer is coupled to the bias detector to provide an error signal from the slicer to the bias detector. The bias detector is configured to determine a difference between an error input and an error mean for the error signal to detect a presence of correlated data in input signaling.
申请公布号 US8923380(B1) 申请公布日期 2014.12.30
申请号 US201314053344 申请日期 2013.10.14
申请人 Xilinx, Inc. 发明人 Malhotra Gaurav
分类号 H03H7/30;H04B1/709;H04B1/16 主分类号 H03H7/30
代理机构 代理人 Webostad W. Eric
主权项 1. An apparatus, comprising: a bias detector; and a slicer coupled to the bias detector to provide an error signal from the slicer to the bias detector; wherein the bias detector is configured to determine a difference between an error input and an error mean for the error signal to detect a presence of correlated data in input signaling.
地址 San Jose CA US