发明名称 SEMICONDUCTOR DEVICE
摘要 A protection circuit used for a semiconductor device is made to effectively function and the semiconductor device is prevented from being damaged by a surge. A semiconductor device includes a terminal electrode, a protection circuit, an integrated circuit, and a wiring electrically connecting the terminal electrode, the protection circuit, and the integrated circuit. The protection circuit is provided between the terminal electrode and the integrated circuit. The terminal electrode, the protection circuit, and the integrated circuit are connected to one another without causing the wiring to branch. It is possible to reduce the damage to the semiconductor device caused by electrostatic discharge. It is also possible to reduce faults in the semiconductor device.
申请公布号 US2014374754(A1) 申请公布日期 2014.12.25
申请号 US201414480965 申请日期 2014.09.09
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Hirose Atsushi;Shishido Hideaki
分类号 H01L27/02;H01L27/146 主分类号 H01L27/02
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP