| 摘要 |
PROBLEM TO BE SOLVED: To provide a test method for an integrated system that can extract a test item among hardware, firmware and software, on the basis of the function and characteristic value of the integrated system, in development of the integrated system.SOLUTION: In each of hardware, firmware and software, an added and changed function, an electronic component and an element are extracted, which extracts a risk caused in the hardware, firmware and software. Next, importance of the function and characteristic value of an integrated system and fault occurrence probability of the function and characteristic value thereof are determined, degree of the risk of the function and characteristic value is determined, and on the basis of the determined risk, priority of a test item to the function and characteristic value is determined, to thereby perform test. |
