发明名称 OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED LIGHT
摘要 Method and systems are presented for analysing a wavefront using a spectral wavefront analyser to extract optical phase and spectral information at a two dimensional array of sampling points across the wavefront, wherein the relative phase information between the sampling points is maintained. Methods and systems are also presented for measuring an eye by reflecting a wavefront of an eye and measuring the wavefront at a plurality of angles to provide a map of the off-axis relative wavefront curvature and aberration of the eye. The phase accuracy between wavelengths and sample points over a beam aperture offered by these methods and systems have a number of ocular applications including corneal and anterior eye tomography, high resolution retinal imaging, and wavefront analysis as a function of probe beam incident angle for determining myopia progression and for designing and testing lenses for correcting myopia.
申请公布号 WO2014201503(A1) 申请公布日期 2014.12.24
申请号 WO2014AU00637 申请日期 2014.06.20
申请人 CYLITE PTY LTD 发明人 FRISKEN, STEVEN JAMES;FRISKEN, GRANT ANDREW
分类号 G01J9/00;A61B3/10;G01B9/02;G01J3/00;G01J11/00 主分类号 G01J9/00
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