发明名称 PRODUCTION METHOD OF NITRIDE SEMICONDUCTOR THIN FILM AND PRODUCTION METHOD OF NITRIDE SEMICONDUCTOR DEVICE USING THE SAME
摘要 <p>According to an aspect of the present invention, provided is a method of manufacturing a nitride semiconductor thin film which includes a step of preparing a first nitride single crystal layer doped with an n-type impurity, a step of forming etch pits on the surface of the first nitride single crystal layer by using an etch gas, and a step of growing a second nitride single crystal layer on the first nitride single crystal having the etch pits.</p>
申请公布号 KR20140145797(A) 申请公布日期 2014.12.24
申请号 KR20130068397 申请日期 2013.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KEON HUN;KIM, MIN HO;SEO, JONG UK;YOON, SUK HO;LEE, KEE WON;LEE, SANG DON;LEE, HO CHUL
分类号 H01L33/22;H01L33/12 主分类号 H01L33/22
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