METHOD FOR POST-MORTEM PATHOMORPHOLOGIC EXAMINATION OF BRAIN IN CASES OF ENCEPHALOPATHY

摘要

Invention relates to pathomorphology and particularly to post-mortem method of brain examination in cases of encephalopathy. The method comprises determination of skull vault’s largest span along the midline of the skull’s inner surface, skull vault’s largest span along the midline of the skull’s outer surface, cutting a straight fronto-parietal line of underside of the two hemispheres, determining the outer distance between the brain’s frontal horns and a distance along the midline of the lateral ventricle. All measurments taken are compared by given formula.