发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device includes a photolithography process having steps of a developing solution immersing process. The steps of the developing solution immersing process includes step (a) of dropping a developing solution on a silicon carbide semiconductor substrate and forming a developing solution film so as to have a film thickness of more than 6 μm and step (b) of reducing the film thickness of the developing solution film to 6 μm or less.
申请公布号 US2014370445(A1) 申请公布日期 2014.12.18
申请号 US201414242057 申请日期 2014.04.01
申请人 Mitsubishi Electric Corporation 发明人 AYA Sunao;SHIKAMA Shozo;YUKI Hideaki
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor device, comprising a photolithography process, wherein said photolithography process includes a developing solution immersing process, and said developing solution immersing process includes the steps of: (a) dropping a developing solution on a semiconductor substrate and forming a developing solution film so as to have a film thickness of more than 6 μm; and(b) reducing the film thickness of said developing solution film to 6 μm or less.
地址 Tokyo JP