发明名称 INSULATING GATE-TYPE BIPOLAR TRANSISTOR
摘要 <p>An object of the present invention is to provide a trench gate type IGBT achieving both retention of withstand voltage and lowering of ON-state voltage and to provide a method for manufacturing the trench gate type IGBT. The IGBT according to the present invention is an SJ-RC-IGBT which includes a drift layer having super junction structure, and includes an IGBT area and an FWD area on the rear surface. In the IGBT according to the present invention, a first drift layer has an impurity concentration of 1×1015 atms/cm3 or higher and lower than 2×1016 atms/cm3, and a thickness of 10μm or larger and smaller than 50μm; and that a buffer layer has an impurity concentration of 1×1015 atms/cm3 or higher and lower than 2×1016 atms/cm3, and a thickness of 2μm or larger and smaller than 15μm.</p>
申请公布号 KR20140143826(A) 申请公布日期 2014.12.17
申请号 KR20147031076 申请日期 2012.05.29
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 AONO SHINJI;MINATO TADAHARU
分类号 H01L29/78;H01L27/04;H01L29/739 主分类号 H01L29/78
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