| 发明名称 |
Latency measurement |
| 摘要 |
Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts. |
| 申请公布号 |
US8914254(B2) |
申请公布日期 |
2014.12.16 |
| 申请号 |
US201213362238 |
申请日期 |
2012.01.31 |
| 申请人 |
Microsoft Corporation |
发明人 |
Uzelac Aleksandar;Stevens David A.;Batchvarov Andrey B.;Lee Changsin;Shigemitsu Takahiro |
| 分类号 |
G06F11/30;G21C17/00;G06F3/041;G06F3/043 |
主分类号 |
G06F11/30 |
| 代理机构 |
|
代理人 |
Churna Timothy;Drakos Kate;Minhas Micky |
| 主权项 |
1. A test apparatus comprising:
one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as movement; and one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts. |
| 地址 |
Redmond WA US |
