SEMICONDUCTOR TEST METHOD AND SYSTEM BASED ON CONTROLLER AREA NETWORK

摘要

Disclosed is a method for testing a semiconductor based on a controller area network (CAN) communication. The method includes the steps of: receiving a data frame to test a device-under-test (DUT) from a main controller through a CAN bus; determining an operation mode of a test interface as at least either a test mode to test the DUT or a general mode to perform a predetermined general operation of the DUT based on the data frame in a test interface controller included in the test interface; and supplying the data frame to multiple shift scan chains included in the DUT to test the DUT if the operation mode of the test interface is determined as the test mode.