发明名称 |
SILICON-BASED SUBSTRATE, SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon-based substrate capable of favorably maintaining crystallinity of a nitride-based compound semiconductor layer formed on an upper layer while improving warpage of the substrate.SOLUTION: A silicon-base substrate for forming a nitride-based compound semiconductor layer on a surface thereof includes: a first part on a surface side having a first impurity concentration; and a second part having a second impurity concentration higher than the first impurity concentration and being on an inner side than the first part. The first impurity concentration is 1×10atoms/cmor more and less than 1×10atoms/cm. |
申请公布号 |
JP2014236093(A) |
申请公布日期 |
2014.12.15 |
申请号 |
JP20130116208 |
申请日期 |
2013.05.31 |
申请人 |
SANKEN ELECTRIC CO LTD;SHIN ETSU HANDOTAI CO LTD |
发明人 |
SHIKAUCHI HIROSHI;SATO KEN;GOTO HIROICHI;SHINOMIYA MASARU;TSUCHIYA KEITARO;HAGIMOTO KAZUNORI |
分类号 |
H01L21/20;H01L21/205;H01L21/336;H01L21/338;H01L29/778;H01L29/78;H01L29/812 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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