| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a temperature characteristic arithmetic unit for a power semiconductor device, which can accurately and easily obtain the temperature characteristic of the power semiconductor device without using a large-scale and high-installation-cost special temperature-stabilization unit such as a thermostatic chamber and temperature plate.SOLUTION: A temperature characteristic arithmetic unit includes: a DC power supply circuit 1; a current detection circuit 3 of a main circuit; a feedback circuit 11 that drives and controls the power semiconductor device 2 so as to minimize a deviation between a detected voltage and target voltage; and an inter-terminal voltage measuring circuit 8 that measures an inter-terminal voltage related to a temperature characteristic in a power semiconductor device 2. An arithmetic control circuit 5 controls the feedback circuit 11 on the basis of a detected temperature and the measured inter-terminal voltage; when the detected temperature reaches a first reference temperature and when it reaches a second reference temperature, respectively obtains the value of the measured inter-terminal voltage together with the value of the detected temperature in a set; and obtains a temperature characteristic of a temperature-terminal voltage interrelationship on the basis of those two sets of detected temperature value and measured inter-terminal voltage value.</p> |
