发明名称 SEMICONDUCTOR PROCESS
摘要 A semiconductor process includes the following steps. A substrate is provided. At least a fin-shaped structure is formed on the substrate and a gate structure partially overlapping the fin-shaped structure is formed. Subsequently, a dielectric layer is blanketly formed on the substrate, and a part of the dielectric layer is removed to form a first spacer on the fin-shaped structure and a second spacer besides the fin-shaped structure. Furthermore, the second spacer and a part of the fin-shaped structure are removed to form at least a recess at a side of the gate structure, and an epitaxial layer is formed in the recess.
申请公布号 US2014363935(A1) 申请公布日期 2014.12.11
申请号 US201313912218 申请日期 2013.06.07
申请人 UNITED MICROELECTRONICS CORP. 发明人 Fu Ssu-I;Chen Cheng-Guo;Hung Yu-Hsiang;Chang Chung-Fu;Lin Chien-Ting
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项 1. A semiconductor process, comprising: providing a substrate; forming at least a fin-shaped structure in the substrate; forming a gate structure partially overlapping the fin-shaped structure; blanketly forming a dielectric layer on the substrate; removing a part of the dielectric layer to form a first spacer on the fin-shaped structure and a second spacer besides the fin-shaped structure; removing the second spacer and a part of the fin-shaped structure to form at least a recess at a side of the gate structure; and forming an epitaxial layer in the recess.
地址 Hsin-Chu City TW