发明名称 Single-poly floating-gate transistor comprising an erase gate formed in the substrate
摘要 <p>An erasable programmable single-poly nonvolatile memory includes a substrate structure; a first PMOS transistor comprising a select gate (34), a first source/drain region (31), and a second source/drain region (32), wherein the select gate is connected to a select gate voltage, and the first source/drain region is connected to a source line voltage; a second PMOS transistor comprising the second source/drain region (32), a third source/drain region (33), and a floating gate (36), wherein the third source/drain region is connected to a bit line voltage and the first, second and third source/drain regions are constructed in an N-well region (NW); and an erase gate region (35) adjacent to the floating gate (36), wherein the erase gate region comprises an n-type source/drain region (38) connected to an erase line voltage and a P-well region (PW); wherein the N-well region (NW) and the P-well region (PW) are formed in the substrate structure.</p>
申请公布号 EP2811530(A1) 申请公布日期 2014.12.10
申请号 EP20130170432 申请日期 2013.06.04
申请人 EMEMORY TECHNOLOGY INC. 发明人 CHEN, WEI-REN;HSU, TE-HSUN;LEE, WEN-HAO
分类号 H01L29/788;G11C16/04;H01L27/115 主分类号 H01L29/788
代理机构 代理人
主权项
地址