发明名称 SUBSTRATE PROCESSING APPARATUS AND NOZZLE CLEANING METHOD
摘要 <p>The present invention is to improve cleaning performance and secure miniaturization. A substrate processing apparatus according to an embodiment includes a first nozzle an a second nozzle which injects a processing liquid to a substrate, a moving unit which moves the first nozzle and the second nozzle, and a nozzle cleaning device which cleans at least a second nozzle. The nozzle cleaning device includes a cleaning bath and an overflow bath. The cleaning bath includes a storing part which stores a cleaning solution for cleaning at least the second nozzle and an overflow part which discharges a cleaning solution flowing over a predetermined water level from the storing part. The overflow bath is adjacent to the cleaning bath and discharges the cleaning solution discharged from the overflow to the outside.</p>
申请公布号 KR20140141514(A) 申请公布日期 2014.12.10
申请号 KR20140065736 申请日期 2014.05.30
申请人 TOKYO ELECTRON LIMITED 发明人 KAI YOSHIHIRO;IKEDA YOSHINORI;SHINOHARA KAZUYOSHI;ODA TETSUYA;TANAKA SATORU;YOSHIDA YUKI;AIBARA MEITOKU
分类号 H01L21/302;H01L21/02 主分类号 H01L21/302
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