发明名称 Semiconductor structure and method for manufacturing the same
摘要 The present invention provides a method for manufacturing a semiconductor structure, which comprises: providing an SOI substrate, forming a gate structure on the SOI substrate; etching an SOI layer of the SOI substrate and a BOX layer of the SOI substrate on both sides of the gate structure to form trenches, the trenches exposing the BOX layer and extending partly into the BOX layer; forming sidewall spacers on sidewalls of the trenches; forming inside the trenches a metal layer covering the sidewall spacers, wherein the metal layer is in contact with the SOI layer which is under the gate structure. Accordingly, the present invention further provides a semiconductor structure formed according to aforesaid method. The manufacturing method and the semiconductor structure according to the present invention make it possible to reduce capacitance between a metal layer and a body silicon layer of an SOI substrate when a semiconductor device is in operation, which is therefore favorable for enhancing performance of the semiconductor device.
申请公布号 US8906753(B2) 申请公布日期 2014.12.09
申请号 US201113380857 申请日期 2011.08.25
申请人 The Institute of Microelectronics Chinese Academy of Science 发明人 Yin Haizhou;Zhu Huilong;Luo Zhijiong
分类号 H01L21/28;H01L29/417;H01L29/66;H01L29/423;H01L29/78 主分类号 H01L21/28
代理机构 Treasure IP Group, LLC 代理人 Treasure IP Group, LLC
主权项 1. A method for manufacturing a semiconductor structure, which comprises: a) providing an SOI substrate, and forming a gate structure (200) on the SOI substrate; b) etching an SOI layer (100) of the SOI substrate and a BOX layer (110) of the SOI substrate on both sides of the gate structure (200) to form trenches (140), the trenches exposing the BOX layer (110) and extending partly into the BOX layer (110); c) forming sidewall spacers (160) on sidewalls of the trenches (140); and d) forming inside the trenches (140) a metal layer (150) covering the sidewall spacers (160), wherein the metal layer (150) is in contact with the SOI layer (100) which is under the gate structure (200).
地址 Beijing CN