<p>Provided is a method for manufacturing a semiconductor device. The method for manufacturing the semiconductor device includes the steps of: forming a trench on a substrate; forming an insulation film pattern in the trench; depositing an amorphous material on the insulation film pattern and the substrate; flattening the amorphous material; removing a part of the amorphous material on a region with the trench; crystallizing the amorphous material into a single crystalline material; and flattening the single crystalline material.</p>
申请公布号
KR20140140339(A)
申请公布日期
2014.12.09
申请号
KR20130061058
申请日期
2013.05.29
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
SHIN, JOONG HAN;KUH, BONG JIN;KIM, TAE GON;CHOI, HAN MEI;KIM, JEONG MEUNG;LIM, JONG SUNG