发明名称 EVALUATION SUBSTRATE, ENVIRONMENTAL TEST DEVICE, AND EVALUATION METHOD OF SAMPLE
摘要 PROBLEM TO BE SOLVED: To provide an evaluation substrate that hardly causes variations in test temperature and is capable of precisely evaluating temperature characteristics of a sample even when a sample performing self-heating is evaluated.SOLUTION: An evaluation substrate evaluates a sample 10 by energizing the sample 10 to expose the sample 10 to a desired temperature. The evaluation substrate includes: a substrate body 2 having a planar area; a mount part 3 capable of mounting the sample 10; and a heater 8 for heating the substrate body 2. The evaluation substrate is configured such that the mount parts 3 are located at one main surface side of the substrate body 2, the heater 8 is distributed in a planar fashion at the other main surface side of the substrate body 2, being integrated.
申请公布号 JP2014228463(A) 申请公布日期 2014.12.08
申请号 JP20130109866 申请日期 2013.05.24
申请人 ESPEC CORP 发明人 TANAKA HIDEKI
分类号 G01N17/00 主分类号 G01N17/00
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