发明名称 DETECTION DEVICE AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a detection device and a program capable of easily detecting a mask pattern having graphical features identical with or similar to those of a reference pattern registered in a library while suppressing the amount of data in the library.SOLUTION: A detection device 10 detects a mask pattern having graphical features identical with or similar to those of a reference pattern from among a plurality of mask patterns forming a photomask used for manufacture of a semiconductor device. The detection device 10 comprises: an extraction unit 40 for extracting a plurality of graphical feature points from the mask patterns and the reference pattern, respectively; an imparting unit 50 for imparting identification information of a feature point and direction information of a line segment connecting the feature point and an adjacent feature point to each of the feature points extracted by the extraction unit by the mask patterns and the reference pattern; and a detection unit 60 for detecting the mask patterns having graphical features identical with or similar to those of the reference pattern on the basis of the identification information and the direction information that the imparting unit 50 has imparted by the mask patterns and the reference pattern.
申请公布号 JP2014228801(A) 申请公布日期 2014.12.08
申请号 JP20130110305 申请日期 2013.05.24
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 SAKURAI MITSUO;MINEMURA MASAHIKO;DOI KAZUMASA;HOSONO KOJI
分类号 G03F1/68 主分类号 G03F1/68
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