发明名称 IMPEDANCE MATCHING DEVICE
摘要 An impedance matching device includes an input port connected to a high-frequency power supply, an output port connected to a load, an impedance variable circuit, a T-parameter memory for storing sets of T-parameters in a manner such that each of the sets of T-parameters is related to a corresponding one of adjustable impedance values of the device, an input voltage detector for detecting a forward wave voltage and a reflected wave voltage at the input port, and a p-p value calculator for computation of a p-p value of a high-frequency voltage at the output port. The computation of the p-p value of the high-frequency voltage is performed by using the forward wave voltage and the reflected wave voltage detected at the input port and also using one set of the T-parameters stored in the T-parameter memory.
申请公布号 US2014354173(A1) 申请公布日期 2014.12.04
申请号 US201414185268 申请日期 2014.02.20
申请人 DAIHEN Corporation 发明人 MATSUNO Daisuke
分类号 H01J37/32 主分类号 H01J37/32
代理机构 代理人
主权项 1. An impedance matching device configured to be disposed between a high-frequency power supply and a load, the matching device comprising: an input port connected to the high-frequency power supply; an output port connected to the load; an impedance variable circuit having a plurality of impedance values to be selected; a T-parameter memory that stores sets of T-parameters relating to the impedance matching device in a manner such that each of the sets of T-parameters is related to a corresponding one of the plurality of impedance values; an input voltage detector that detects a forward wave voltage and a reflected wave voltage at the input port; and a p-p value calculator for computation of a p-p value of a high-frequency voltage at the output port; wherein the computation of the p-p value of the high-frequency voltage is performed by using the forward wave voltage and the reflected wave voltage detected at the input port and also using one set of T-parameters stored in the T-parameter memory.
地址 Osaka JP
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