发明名称 |
Method of forming layers using atomic layer deposition |
摘要 |
Nanocrystal structures formed using atomic layer deposition (ALD) processes are useful in the formation of integrated circuits such as memory devices. Rather than continuing the ALD process until a continuous layer is formed, the ALD process is halted prematurely to leave a discontinuous formation of nanocrystals which are then capped by a different material, thus forming a layer with a discontinuous portion and a bulk portion. Such nanocrystals can serve as charge-storage sites within the bulk portion, and the resulting structure can serve as a floating gate of a floating-gate memory cell. A floating gate may contain one or more layers of such nanocrystal structures. |
申请公布号 |
US8900946(B2) |
申请公布日期 |
2014.12.02 |
申请号 |
US201414171010 |
申请日期 |
2014.02.03 |
申请人 |
Micron Technology, Inc. |
发明人 |
Majhi Prashant;Min Kyu S.;Tsai Wilman |
分类号 |
H01L21/336;H01L21/28;H01L21/314;H01L21/02;B82Y10/00;H01L29/423 |
主分类号 |
H01L21/336 |
代理机构 |
Dicke, Billig & Czaja, PLLC |
代理人 |
Dicke, Billig & Czaja, PLLC |
主权项 |
1. A method of forming a layer, comprising:
depositing a first material using an atomic layer deposition process, wherein the atomic layer deposition process comprises using a particular set of precursors during one or more cycles of the atomic layer deposition process to define a nucleation density of the first material, and using a different set of precursors during subsequent cycles of the atomic layer deposition process; halting the atomic layer deposition process of the first material before the deposited first material forms a continuous layer; and forming a second material over the first material; wherein the second material is different than the first material. |
地址 |
Boise ID US |