TUNING-FORK BASED NEAR FIELD PROBE FOR MESURING SPECTRAL AND NEAR-FIELD MICROSCOPY USING THE SAME, SPECTRAL ANALYTICAL METHOD USING NEAR-FIELD MICROSCOPY

摘要

The present invention is provided for removing scatterings from parts other than an end part of a nano probe of a near-field microscope, and for allowing a spectrum to be analyzed by delaying a multiple reflection wave, which is generated through a shaft of the nano probe, from being generated. A first feature of the present invention, in which a near-field probe includes a first electrode and a second electrode, which are spaced apart from each other, and a nano probe attached to an end of a side of the first electrode in a downward direction and having a wire shape, which is vertically vibrating, is to temporally delay the multiple reflection wave from being generated by making a length of a probe part to be at least a predetermined length. A second feature of the present invention is to provide a near-field microscope including a tuning-folk based near-field probe having the same structure as described above, and able to measure a time region transient reaction of a scattering wave. A third feature of the present invention is to provide a method of analyzing a spectrum of the time region signal measured from the near-field microscope.