| 摘要 |
Automated assessment of registration quality, focus, and area defects in sequentially acquired images, such as images acquired by a digital microscope, is disclosed. In one embodiment, acquired images are registered and whole-image defects are automatically detected based on a figure of merit generated by the registration process. In related implementations, area defects may be automatically detected by calculating correlations in localized image regions for images acquired in different imaging rounds. |
