发明名称 WAFER TRANSPORT APPARATUS
摘要 An object is to make it possible to adequately reduce the wafer transport time and to contribute to size-reduction of the semiconductor processing system.;Two wafer supports (3, 4) on which wafers (100) are placed are arranged to be apart from each other by a distance (D) in a vertical direction . To transport two wafers (100) to respective loading stages (200A, 200B), first a wafer (100) placed on the lower wafer support (3) is subjected to correction of its position in its main plane, and the wafer supports (3, 4) are descended. After the wafer (100) placed on the wafer support (3) is loaded onto pins (211-213), another wafer (100) placed on the upper wafer support (4) is subjected to correction of its position in its main plane, and the wafer supports (3, 4) are descended.
申请公布号 US2014348622(A1) 申请公布日期 2014.11.27
申请号 US201114365419 申请日期 2011.12.15
申请人 Yamazoe Katsuhiro;Imai Shinichi;Sakata Kosuke;Nishijima Yoshiki;Tsukimoto Hiroaki 发明人 Yamazoe Katsuhiro;Imai Shinichi;Sakata Kosuke;Nishijima Yoshiki;Tsukimoto Hiroaki
分类号 H01L21/67;B25J11/00 主分类号 H01L21/67
代理机构 代理人
主权项 1. A wafer transport apparatus for transporting a plurality of wafers to a plurality of loading stages at a time, the wafer transport apparatus comprising: a main body; a handling arm supported on the main body movably at least in a main plane of each of the wafers; a plurality of wafer supports each being supported on the handling arm and holding a single wafer; a plurality of detection units for detecting positions of the wafers in their main planes at the plurality of loading stages, respectively; and a control unit for correcting positions in the main planes of the wafers respectively held by the plurality of wafer supports sequentially at different heights from one another at the loading stages based on detection results of the detection units.
地址 Okayama JP