发明名称 化学機械研磨パッドおよびそれを用いた化学機械研磨方法
摘要 PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad which can improve a flatness of a surface to be polished in CMP and reduce a polishing defect (scratch) at the same time and a chemical mechanical polishing method using the chemical mechanical polishing pad.SOLUTION: The chemical mechanical polishing pad has a polishing layer formed with a composition including thermoplastic polyurethane. The specific gravity of the polishing layer is 1.15 or higher and 1.30 or lower and the duro D hardness of the polishing layer is 50D or higher and 80D or lower.
申请公布号 JP5630609(B2) 申请公布日期 2014.11.26
申请号 JP20100272451 申请日期 2010.12.07
申请人 发明人
分类号 B24B37/24;H01L21/304 主分类号 B24B37/24
代理机构 代理人
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