The present invention relates to an apparatus and a method for inspecting a structure. The structure inspecting apparatus according to an embodiment of the present invention includes: a modeling unit which models a structure based on multiple images which are made by photographing the structure; a projection image generating unit which generates a projection image which projects the modeled structure in a preset direction; and a matching unit which detects a discordance part between two images by matching the projection image with a drawing of the structure.
申请公布号
KR20140135513(A)
申请公布日期
2014.11.26
申请号
KR20130055888
申请日期
2013.05.16
申请人
SAMSUNG HEAVY IND. CO., LTD.
发明人
LEE, JEONG HWAN;CHO, DONG KYUN;CHO, HYEON WOO;CHOI, DOO JIN