发明名称 APPARATUS AND METHOD FOR INSPECTING STRUCTURE
摘要 The present invention relates to an apparatus and a method for inspecting a structure. The structure inspecting apparatus according to an embodiment of the present invention includes: a modeling unit which models a structure based on multiple images which are made by photographing the structure; a projection image generating unit which generates a projection image which projects the modeled structure in a preset direction; and a matching unit which detects a discordance part between two images by matching the projection image with a drawing of the structure.
申请公布号 KR20140135513(A) 申请公布日期 2014.11.26
申请号 KR20130055888 申请日期 2013.05.16
申请人 SAMSUNG HEAVY IND. CO., LTD. 发明人 LEE, JEONG HWAN;CHO, DONG KYUN;CHO, HYEON WOO;CHOI, DOO JIN
分类号 G06T7/00;G06T17/00 主分类号 G06T7/00
代理机构 代理人
主权项
地址