发明名称 Two terminal resistive switching device structure and method of fabricating
摘要 A method forms a two terminal device. The method includes forming a first dielectric material overlying a surface region of a substrate. A bottom wiring material is formed overlying the first dielectric material and a switching material is deposited overlying the bottom wiring material. The bottom wiring material and the switching material is subjected to a first patterning and etching process to form a first structure having a top surface region and a side region. The first structure includes at least a bottom wiring structure and a switching element having a first side region, and a top surface region including an exposed region of the switching element. A second dielectric material is formed overlying at least the first structure including the exposed region of the switching element. The method forms an opening region in a portion of the second dielectric layer to expose a portion of the top surface region of the switching element. A top wiring material including a conductive material is formed overlying at lease the opening region such that the conductive material is in direct contact with the switching element. A second etching process is performed to form at least a top wiring structure. In a specific embodiment, the side region of the first structure including a first side region of the switching element is free from a contaminant conductive material from the second etching process.
申请公布号 EP2408035(A3) 申请公布日期 2014.11.26
申请号 EP20110005649 申请日期 2011.07.11
申请人 CROSSBAR, INC. 发明人 JO, SUNG HYUN;HERNER, SCOTT BRAD
分类号 H01L45/00 主分类号 H01L45/00
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