| 摘要 |
<p>The present invention provides a tip-enhanced raman spectroscopy system using metal nanoparticles, a microscope using the same, and a measurement method thereof. The microscope comprises: a probe arranged close to an object to be measured, and having a metal tip; a light source for irradiating light to the probe; metal nanoparticles distributed on the top surface or the bottom surface of the object to be measured to increase an electromagnetic field generated by the light between the object and the probe, or an auxiliary probe arranged close to the probe to increase the electromagnetic field between the object and the probe; a light collection part for collecting signals radiated from the object to be measured; and a detection part for detecting the raman spectrum of the collected signals. The electromagnetic field is concentrated between the probe and the nanoparticles to strength raman spectroscopic signals and increase nanometer spatial resolving power.</p> |
