发明名称 Optical inspection method
摘要 An optical inspection method including the following steps is disclosed. A tester is utilized to obtain an image of an inspection object. A target image region of the image is determined. Multiple central coordinates of multiple inspection ranges of a target image region are obtained. The central coordinates are filled to an array, and then the central coordinates are reordered according to relative relationships of the central coordinates to obtain a reordered coordinate array. The reordered coordinate array is compared with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.
申请公布号 US8897540(B2) 申请公布日期 2014.11.25
申请号 US201313842921 申请日期 2013.03.15
申请人 Quanta Computer Inc. 发明人 Lin Chin-Lin
分类号 G06K9/00;G06T7/00 主分类号 G06K9/00
代理机构 Rabin & Berdo, P.C. 代理人 Rabin & Berdo, P.C.
主权项 1. An optical inspection method, comprising: utilizing a tester to obtain an image of an inspection object; determining a target image region of the image; obtaining a plurality of central coordinates of a plurality of inspection ranges of the target image region; filling the central coordinates to an array and reordering the central coordinates according to relative relationships of the central coordinates to obtain a reordered coordinate array; and comparing the reordered coordinate array with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.
地址 Tao Yuan Shien TW