发明名称 |
Photoelectric conversion device |
摘要 |
A main object of the present invention is to provide a photoelectric conversion device which is capable of improving the photoelectric conversion efficiency. The invention comprises: a p-layer; an n-layer; an i-layer disposed between the p-layer and the n-layer; a first electrode connected to the p-layer; and a second electrode connected to the n-layer, wherein the i-layer comprises a wall layer constituted by a first semiconductor, and a quantum structure portion constituted by a second semiconductor disposed in the wall layer; a band gap of the first semiconductor is wider than that of the second semiconductor; when a concentration of the n-type impurity that may be contained in the middle of the i-layer in a thickness direction thereof is defined as Cn1, a concentration of the n-type impurity that may be contained in the region on the p-layer side of the i-layer is defined as Cn2, a concentration of the p-type impurity that may be contained in the middle of the i-layer in a thickness direction thereof is defined as Cp1, and a concentration of the p-type impurity that may be contained in the region on the n-layer side of the i-layer is defined as Cp2, the relations Cn1<Cn2 and/or Cp1<Cp2 are satisfied. |
申请公布号 |
US8895840(B2) |
申请公布日期 |
2014.11.25 |
申请号 |
US200913383489 |
申请日期 |
2009.07.23 |
申请人 |
Toyota Jidosha Kabushiki Kaisha |
发明人 |
Suto Hiroyuki |
分类号 |
H01L31/06;H01L31/02;H01L31/075;H01L31/0352 |
主分类号 |
H01L31/06 |
代理机构 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
代理人 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
主权项 |
1. A photoelectric conversion device comprising:
a p-layer; an n-layer; an i-layer disposed between the p-layer and the n-layer, the i-layer comprising:
a wall layer including a first semiconductor; anda quantum structure portion including a second semiconductor and disposed in the wall layer,wherein:
a band gap of the first semiconductor is wider than a band gap of the second semiconductor,at least one of a first region on an n-layer side of the i-layer contains a p-type impurity or a second region on a p-layer side of the i-layer contains an n-type impurity,in a case where the first region contains the p-type impurity, a relation Cp1<Cp2 is satisfied, where Cp1 denotes a concentration of the p-type impurity at a middle of the i-layer in a thickness direction of the i-layer, and Cp2 denotes a concentration of the p-type impurity in the first region, andin a case where the second region contains the n-type impurity, a relation Cn1<Cn2 is satisfied, where Cn1 denotes a concentration of the n-type impurity at the middle of the i-layer in the thickness direction, and Cn2 denotes a concentration of the n-type impurity in the second region; a first electrode connected to the p-layer; a second electrode connected to the n-layer; and at least one of a first insulating layer disposed between the p-layer and the first electrode or a second insulating layer disposed between the n-layer and the second electrode. |
地址 |
Toyota-shi, Aichi-ken JP |