发明名称 MANUFACTURING METHOD OF SILICON EPITAXIAL WAFER AND SILICON EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To provide an industrially excellent silicon epitaxial wafer and a manufacturing method of the silicon epitaxial wafer which is used for a semiconductor device substrate of a memory device, a logic device, or a solid state imaging device, and uses a carbon-doped silicon substrate as raw material.SOLUTION: This invention provides a silicon epitaxial wafer and a manufacturing method of the silicon epitaxial wafer which has a second intermediate epitaxial layer 22 and a first intermediate epitaxial layer 21 doped with a dopant on a silicon substrate 10 cut dowm from a silicon single crystal rod grown by a czochralski method with a carbon concentration of 3×10- 2×10atoms/cmgrown. An epitaxial layer 30 as an element formation region is stacked on the first intermediate epitaxial layer 21.
申请公布号 JP2014218411(A) 申请公布日期 2014.11.20
申请号 JP20130100180 申请日期 2013.05.10
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 SAKURADA MASAHIRO
分类号 C30B29/06;H01L21/02;H01L21/205 主分类号 C30B29/06
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