The invention relates to a matrix device for measuring characteristics of an X-ray beam. Said device includes a first set (32) of detection cells of a size different from the cells of at least one second set (33, 34) of detection cells. Each cell corresponds to an ionization chamber including a detection electrode. The detection electrodes of all the cells have the same effective surface for collecting charges.
申请公布号
WO2014184496(A1)
申请公布日期
2014.11.20
申请号
WO2014FR51132
申请日期
2014.05.15
申请人
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE;UNIVERSITE JOSEPH FOURIER