发明名称 タングステン含有基材の研磨組成物
摘要 <p>The invention provides a method of chemically-mechanically polishing a substrate comprising tungsten through use of a composition comprising a tungsten etchant, an inhibitor of tungsten etching, and water, wherein the inhibitor of tungsten polishing is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom. The invention further provides a chemical-mechanical polishing composition particularly useful in polishing tungsten-containing substrates.</p>
申请公布号 JP5628990(B2) 申请公布日期 2014.11.19
申请号 JP20130217869 申请日期 2013.10.18
申请人 发明人
分类号 H01L21/304;B24B37/00;C09G1/02;C09K3/14;C23F3/06;H01L21/321 主分类号 H01L21/304
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