发明名称 Electrode testing method and electrode testing apparatus
摘要 In a state in which two probes contact each electrode, the contact of the probes with each electrode is checked at the electrode (S100), and a short-circuit test between electrodes is conducted using each one probe from each of pairs of probes where contact has been confirmed (S110, S140). In this manner, since a short-circuit test between electrodes is conducted after it is confirmed that the probes contact each electrode, a short-circuit determination error caused by the fact that the probes are not in contact with each electrode is prevented, thereby improving the reliability of a test.
申请公布号 EP2803989(A1) 申请公布日期 2014.11.19
申请号 EP20140167731 申请日期 2014.05.09
申请人 NGK INSULATORS, LTD. 发明人 KATO, KENJI;INA, NORIYUKI
分类号 G01N27/406;G01N27/417 主分类号 G01N27/406
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