发明名称 Memory device from which dummy edge memory block is removed
摘要 A semiconductor memory device having an open bitline memory structure from which an edge dummy memory block is removed, the semiconductor memory device includes a memory block, an edge sense amplification block including a first sense amplifier having a first bitline, a first complementary bitline, and a first amplification circuit comprising a first transistor having a first size, a central sense amplification block including a second sense amplifier having a second bitline, a second complementary bitline, and a second amplification circuit comprising a second transistor having a second size different from the first size, a capacitor block electrically connected to the edge sense amplification block.
申请公布号 US8891324(B2) 申请公布日期 2014.11.18
申请号 US201313915338 申请日期 2013.06.11
申请人 Samsung Electronics Co., Ltd. 发明人 Yi Chul-woo;Jang Seong-jin;Kwak Jin-seok;Ko Tai-young;Kim Joung-yeal;Kim Sang-yun;Park Sang-kyun;Lee Jung-bae
分类号 G11C7/00;G11C5/06;G11C7/06;H01L27/02;H01L27/105;G11C7/18;G11C11/4091;H01L27/108 主分类号 G11C7/00
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A semiconductor memory device having an open bitline memory structure, comprising: an edge sense amplification block comprising a first sense amplifier connected to a first memory cell arrangement of an edge memory block, the first sense amplifier comprising a first equalization circuit connected to a first power signal; a central sense amplification block comprising a second sense amplifier connected to a second memory cell arrangement of the edge memory block, the second sense amplifier comprising a second equalization circuit connected to a second power signal; and a power generation device that generates the first power signal and the second power signal, wherein the first power signal is provided to the first equalization circuit through a different signal path than the second power signal is provided to the second equalization circuit.
地址 Suwon-si, Gyeonggi-do KR