发明名称 EXPOSURE DEVICE, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To suppress the leakage of liquid during the exchange of wafers in a liquid immersion exposure device.SOLUTION: An exposure device includes: a first stage WST1 that can move while mounting a substrate thereon within a predetermined area including a first area where a projection optical system PL is arranged and a second area different from the first area; a second stage WST2 that can move within the predetermined area; a linear motor system that moves the first and second stages respectively from one side to the other side in the first and second areas and moves the first and second stages independently within the predetermined area; a liquid immersion system that supplies a liquid immediately below the projection optical system to form a liquid immersion area; and a control system that moves the first and second stages below the projection optical system with the linear motor system while maintaining the liquid immersion area immediately below the projection optical system so that one of a fist state where the liquid immersion area is maintained between the projection optical system and the first stage and a second state where the liquid immersion area is maintained between the projection optical system and the second stage is shifted to the other.
申请公布号 JP2014212330(A) 申请公布日期 2014.11.13
申请号 JP20140122324 申请日期 2014.06.13
申请人 NIKON CORP 发明人 SHIBAZAKI YUICHI
分类号 H01L21/027;G03F7/20;H01L21/68 主分类号 H01L21/027
代理机构 代理人
主权项
地址