发明名称 ETCHING METHOD, ETCHING SOLUTION USED IN SAME, ETCHING SOLUTION KIT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE PRODUCT
摘要 The present invention is an etching method which, with regard to a semiconductor substrate having a first layer including germanium (Ge), and a second layer that includes at least one type of specific metal element selected from nickel platinum (NiPt), titanium (Ti), nickel (Ni), and cobalt (Co), selectively removes the second layer, said etching method removing the second layer by causing an etching solution including an organic alkali compound to come into contact with the second layer.
申请公布号 WO2014178424(A1) 申请公布日期 2014.11.06
申请号 WO2014JP62069 申请日期 2014.05.01
申请人 FUJIFILM CORPORATION 发明人 KAMIMURA, TETSUYA;KOYAMA, AKIKO;TAKAHASHI, SATOMI;MIZUTANI, ATSUSHI;SUGISHIMA, YASUO
分类号 H01L21/306;H01L21/28;H01L21/308 主分类号 H01L21/306
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