发明名称 METHOD FOR ETCHING FILM INCLUDING TRANSITION METAL
摘要 PROBLEM TO BE SOLVED: To provide a method for etching a film including a transition metal using a substrate processing device.SOLUTION: A substrate processing device comprises: a processing container defining a processing chamber and a plasma generating chamber; and a shielding part provided between the processing chamber and the plasma generating chamber, including a plurality of openings for communicating between the processing chamber and the plasma generating chamber, and having shielding properties to ultraviolet light. A method for etching a film including a transition metal using a substrate processing device comprises: (a) a step ST1 of supplying neutral particles of an oxygen atom to a processing chamber housing a workpiece having the film by generating plasma of a first gas containing oxygen in the plasma generating chamber; (b) a step ST2 of supplying a second gas for complexing the oxidized transition metal to the processing chamber; and (c) a step ST3 of supplying neutral particles of a rare gas atom to the processing chamber by generating plasma of a rare gas in the plasma generating chamber.
申请公布号 JP2014209552(A) 申请公布日期 2014.11.06
申请号 JP20140005194 申请日期 2014.01.15
申请人 TOKYO ELECTRON LTD;TOHOKU UNIV 发明人 TANI SHUN;SAGAWA SEIJI
分类号 H01L21/3065;H01L43/12 主分类号 H01L21/3065
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