发明名称 |
SILICON WAFER POLISHING COMPOSITION, AND METHOD IN CONNECTION THEREWITH |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a polishing composition for final polishing in order to reduce a silicon wafer surface defect.SOLUTION: Provided are a chemical mechanical polishing composition and a manufacturing method thereof. The chemical mechanical polishing composition comprises: water; a cation expressed by the formula (I); piperazine expressed by the formula (II) or a piperazine derivative; and as required, pH adjuster. The chemical mechanical polishing composition can achieve a silicon-removal rate of at least 300 nm/min.</p> |
申请公布号 |
JP2014209623(A) |
申请公布日期 |
2014.11.06 |
申请号 |
JP20140080721 |
申请日期 |
2014.04.10 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC |
发明人 |
NARESH KUMAR PENTA;COOK LEE MELBOURNE |
分类号 |
H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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