发明名称 上下接点構造を有するスプリングタイプのプローブピン、および上下接点構造を有するスプリングタイププローブピンの製造方法
摘要 <p>Disclosed are a spring-type probe pin having upper and lower contacts, and a manufacturing method thereof. The spring-type probe pin includes: cylindrical upper and lower sleeves having upper and lower grounded portions, respectively, in which one of the sleeves moves to be guided into the other; and a shock-absorbing operation unit provided between the upper and lower sleeves and containing a pair of shock-absorbing springs having a spiral spring form, which are connected to each other in such a manner that a turn of the upper shock-absorbing spring deviates from a turn of the lower shock-absorbing spring, in which the shock-absorbing operation unit performs an elastic shock-absorbing operation up to a position where the upper and lower shock-absorbing springs overlap each other. The cylindrical upper and lower sleeves and the shock-absorbing operation unit are integrally formed by using a press forming process.</p>
申请公布号 JP5619059(B2) 申请公布日期 2014.11.05
申请号 JP20120067739 申请日期 2012.03.23
申请人 发明人
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
代理机构 代理人
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