发明名称 ESD/antenna diodes for through-silicon vias
摘要 Roughly described, an antenna diode is formed at least partially within the exclusion zone around a TSV, and is connected to the TSV by way of a metal 1 layer conductor at the same time that the TSV is connected to either the gate poly or a diffusion region of one or more transistors placed outside the exclusion zone.
申请公布号 US8877638(B2) 申请公布日期 2014.11.04
申请号 US201213567922 申请日期 2012.08.06
申请人 Synopsys, Inc. 发明人 Kawa Jamil;Ni Min;Sproch James D.;Su Qing;Tang Zongwu
分类号 H01L21/44;H01L23/48;H01L23/62;H01L27/02;H01L23/60;G06F17/50 主分类号 H01L21/44
代理机构 Haynes Beffel & Wolfeld LLP 代理人 Haynes Beffel & Wolfeld LLP ;Wolfeld Warren S.
主权项 1. A method for fabricating an integrated circuit, comprising the steps of: providing a semiconductor substrate; forming a TSV passing through the substrate, the substrate having an exclusion zone laterally adjacent to the TSV; forming first, second and third diffusion regions simultaneously in the substrate, the first diffusion region being disposed at least partially within the exclusion zone and the second and third diffusion regions being disposed outside the exclusion zone, the first, second and third diffusion regions being doped to exhibit a first conductivity type, the substrate in at least a region adjacent to the first region being doped to exhibit a second conductivity type opposite the first conductivity type; forming a gate dielectric over the substrate and a gate conductor over the gate dielectric, the second and third diffusion regions, the gate conductor and the gate dielectric all forming parts of a transistor; and forming an M1 layer conductor interconnecting the TSV, the first diffusion region, and the gate conductor.
地址 Mountain View CA US