发明名称 Surface-treated steel sheet and resin-coated steel sheet
摘要 It is an object to provide a surface-treated steel sheet which contains no Cr, which is excellent in wet resin adhesion, and which can be used as an alternative to a conventional tin-free steel sheet and to provide a resin-coated steel sheet produced by coating the surface-treated steel sheet with resin. A surface-treated steel sheet including an adhesive layer which is disposed on at least one surface of the steel sheet and which contains Ti and at least one selected from the group consisting of Co, Fe, Ni, V, Cu, Mn, and Zn, the ratio of the total amount of Co, Fe, Ni, V, Cu, Mn, and Zn to the amount of Ti contained therein being 0.01 to ten on a mass basis, and a method for producing the surface-treated steel sheet.
申请公布号 US8877348(B2) 申请公布日期 2014.11.04
申请号 US200812739959 申请日期 2008.10.30
申请人 JFE Steel Corporation 发明人 Nishihara Yuka;Suzuki Takeshi;Makiishi Noriko;Tanaka Takumi;Iwasa Hiroki;Nakamura Norihiko;Sato Kaoru;Kawano Takashi
分类号 B32B15/01;B32B15/04;B32B15/18;C25D5/10;C25D5/12;C25D5/48;C23C28/02;C23C30/00;C25D7/00;C23C28/00 主分类号 B32B15/01
代理机构 Young & Thompson 代理人 Young & Thompson
主权项 1. A surface-treated steel sheet comprising: an oxygen-containing adhesive layer having a thickness of 20 to 800 nm and which is disposed on at least one surface of the steel sheet and which contains Ti and at least one selected from the group consisting of Co, Fe, Ni, V, Cu, Mn, and Zn, a ratio of the total amount of Co, Fe, Ni, V, Cu, Mn, and Zn to the amount of Ti contained therein being 0.01 to ten on a mass basis, the adhesive layer having been obtained by cathodically electrolyzing in an aqueous solution, and the adhesive layer has bumps arranged with an area density of 16 or more per μm2 and the area density of the bumps of the adhesive layer is defined as a number of the bumps that are 0.005 μm or more higher than an average line of the bumps and recessed portions, the average line being determined from a SEM image of the layer observed with a scanning electron microscope (SEM) that is three-dimensionally analyzed and filtered at a cut-off wavelength of 1.0 μm.
地址 Tokyo JP