发明名称 Diode for variable-resistance material memories, processes of forming same, and methods of using same
摘要 A variable-resistance material memory (VRMM) device includes a container conductor disposed over an epitaxial semiconductive prominence that is coupled to a VRMM. A VRMM device may also include a conductive plug in a recess that is coupled to a VRMM. A VRMM array may also include a conductive plug in a surrounding recess that is coupled to a VRMM. Apparatuses include the VRMM with one of the diode constructions.
申请公布号 US8878276(B2) 申请公布日期 2014.11.04
申请号 US201213529852 申请日期 2012.06.21
申请人 Micron Technology, Inc. 发明人 Liu Jun;Violette Michael P.
分类号 H01L45/00;H01L27/24 主分类号 H01L45/00
代理机构 Schwegman Lundberg & Woessner, P.A. 代理人 Schwegman Lundberg & Woessner, P.A.
主权项 1. An apparatus comprising: a diode plug disposed upon a second-patterned portion of a semiconductive film, wherein the diode plug contacts a first wall, a second wall, a third wall, and a fourth wall of the semiconductive film; an electrode disposed above and on the diode plug; a shallow-trench isolation (STI) adjacent to the Schottky diode; and a variable-resistance material memory (VRMM) cell coupled to the electrode, wherein the variable-resistance material is a doped chalcogenide glass of AxBy, where B is one or more of sulfur, selenium, or tellurium and A is at least one element from B, Al, Ga, In, Tl, C, Si, Ge, Sn, Pb, N, P, As, Sb, Bi, F, Cl, Br, I, or At with dopants of one or more of Au, Ag, Pt, Cu, Cd, In, Ru, Co, Cr, Ni, Mn, or Mo.
地址 Boise ID US