Magnetic field simulator for testing singulated or multi-site strip semiconductor device and method therefor

摘要

A system for testing a magnetic sensor has a plurality of coils, wherein the coils are positioned along perpendicular planes. A magnetic field is generated along each of the perpendicular planes when a current is sent to each of the plurality of coils.

主权项

1. A system for testing magnetic sensors the system comprising:
a plurality of test coils, comprising a test coil positioned within each semiconductor device of an array of semiconductor devices, a test coil positioned along each row of semiconductor devices in the array of semiconductor devices, and a test coil positioned along each column of semiconductor devices in the array of semiconductor devices, each semiconductor device of the array comprising a magnetic sensor, and wherein the test coils are positioned along perpendicular planes; wherein a magnetic field is generated along each of the perpendicular planes for each semiconductor device of the array when a current is sent to each of the plurality of test coils.