发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To improve the reliability of a semiconductor device.SOLUTION: In a semiconductor device 1, a semiconductor chip 8 mounted on a major surface of a package substrate 2 is sealed by a sealing member 11. On the major surface and a rear surface of the package substrate 2, wiring conductor patterns 4 are disposed and dummy conductor patterns 4 are also disposed in regions where the wiring conductor patterns 4 are not formed. Increasing the density of the conductor patterns 4 in the package substrate 2 in the above described manner reduces warpage and swell of the package substrate 2 which are caused by thermal treatment in the manufacturing processes of the semiconductor device 1.</p>
申请公布号 JP2014207471(A) 申请公布日期 2014.10.30
申请号 JP20140134944 申请日期 2014.06.30
申请人 RENESAS ELECTRONICS CORP;RENASAS NORTHERN JAPAN SEMICONDUCTOR INC 发明人 TAKAHASHI NORIYUKI;SUZUKI MASAYUKI;TSUCHIYA KOJI;MATSUURA TAKAO;HASHIZUME TAKANORI;ICHITANI MASAHIRO;SUZUKI KAZUNARI;NISHIDA TAKAFUMI;IMURA KENICHI;MIWA TAKASHI
分类号 H01L23/12 主分类号 H01L23/12
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